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- VIT_P/IR
VIT_P/IR
Codice del prodotto:
VIT_P/IR
Disponibilità:
Disponibile (Il prodotto sarà disponibile il: 09-03-2024)
Prezzo:
€0,00
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/IR series are specially designed for tip or laser spot precise positioning over the point of interest.
Typical Resonant Frequency 300 kHz (guaranteed range 200-400 kHz), Typical Force Constant 50 N/m (guaranteed range 25-95 N/m).
Cantilevers have Au reflective coating. Probes are also available with no coating as well as with conductive tip coating.
Probes are packed in boxes with 15 and 50 pieces. Amount discount is included in the package price.
| General Features | |
|---|---|
| Material | Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped |
| Chip size | 3.4x1.6x0.3mm |
| Reflective side coating | Au |
| Tip coating | No |
| Tip curvature radius | typical 6nm, guaranteed 10nm |
| Available tip coatings | Pt, Au |
| Special Features | |
| Cantilever series | VIT_P/IR |
| Cantilever length, L±10µm | 140 |
| Cantilever width, W±5µm | 50 |
| Cantilever thickness, T±0.5µm | 5.0 |
| Min resonant frequency, kHz | 200 |
| Typical resonant frequency, kHz | 300 |
| Max resonant frequency, kHz | 400 |
| Min force constant, N/m | 25 |
| Typical force constant, N/m | 50 |
| Max force constant, N/m | 95 |
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